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Proceedings Paper

X-ray images of dislocation loops and barriers in silicon crystals in the case of transmission geometry
Author(s): D. Fedortsov; I. Fodchuk; S. Novikov; A. Struk
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Paper Abstract

In this work on the basis of numerical solution of Takagi's equations the diffraction images of various types possible in silicon dislocation loops and barriers are constructed in the case of transmission geometry. The three-dimensional total misorientation functions of dislocation loops and barriers are calculated and its cross sections are analysed. X-ray images of dislocation loops and barriers are simulated in the cases of "thin" (μt<1) and "thick" (μt>10) crystals.

Paper Details

Date Published: 22 April 2008
PDF: 5 pages
Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081A (22 April 2008); doi: 10.1117/12.797223
Show Author Affiliations
D. Fedortsov, Chernivtsi National Univ. (Ukraine)
I. Fodchuk, Chernivtsi National Univ. (Ukraine)
S. Novikov, Chernivtsi National Univ. (Ukraine)
A. Struk, Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 7008:
Eighth International Conference on Correlation Optics

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