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Proceedings Paper

Coincidental multiple x-ray diffraction as tool for precise investigation of crystals
Author(s): M. Borcha; I. Fodchuk; O. Kroitor; Ya. Garabazhiv; O. Kshevetsky
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Paper Abstract

The precision of lattice parameter determination can be significantly risen providing superposition of closely set maxima at Renninger-scan, which are in addition structure and spectral sensitive. This superposition can be achieved by means of lattice parameters change or wavelenght variation. We have realized that in the cases of coincidental coplanar or noncoplanar multiple x-ray diffraction. We have studied evolution of an angular distance between diffraction maxima near the range of coincidental multiple x-ray diffraction depending on stochiometric composition and temperature of sample. It has been shown that sensitivity of multiple diffraction is Δφ/Δa≈13.3 sec of arc /10-6 Å in the region of coincidental coplanar or noncoplanar x-ray diffraction.

Paper Details

Date Published: 22 April 2008
PDF: 7 pages
Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 700819 (22 April 2008); doi: 10.1117/12.797221
Show Author Affiliations
M. Borcha, Chernivtsi National Univ. (Ukraine)
I. Fodchuk, Chernivtsi National Univ. (Ukraine)
O. Kroitor, Chernivtsi National Univ. (Ukraine)
Ya. Garabazhiv, Chernivtsi National Univ. (Ukraine)
O. Kshevetsky, Chernivtsi National Univ. (Ukraine)

Published in SPIE Proceedings Vol. 7008:
Eighth International Conference on Correlation Optics

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