Share Email Print

Proceedings Paper

Shack-Hartmann wavefront sensor for the determination of local inhomogeneities of the surface
Author(s): Andrey A. Goloborodko; Vitalij N. Kurashov; Dmytro V. Podanchuk; Natalia S. Sutyagina
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The modification of the wavefront registration scheme for the purpose of the sensor spatial resolution improvement is considered. It's proposed to use the focused laser beam for illumination of the separate area of the surface, which after the optical transformation in Fourier optics scheme forms the signal in the sensors plane that is proportional to the spectrum of the spatial frequencies of the surface shape. At the same time the spatial resolution in the surface plane is determined by the sensor aperture, but not the spatial resolution of its lenslet array. The theoretical analysis and computer simulation of the wavefront sensor work for the local inhomogeneities determination of thereflective surface is realized. For obtaining the submicron spatial resolution of the sensor it is proposed to classify the surface micro areas by the multidimensional statistical analysis methods.

Paper Details

Date Published: 22 April 2008
PDF: 7 pages
Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081S (22 April 2008); doi: 10.1117/12.797117
Show Author Affiliations
Andrey A. Goloborodko, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Vitalij N. Kurashov, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Dmytro V. Podanchuk, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Natalia S. Sutyagina, Taras Shevchenko National Univ. of Kyiv (Ukraine)

Published in SPIE Proceedings Vol. 7008:
Eighth International Conference on Correlation Optics
Malgorzata Kujawinska; Oleg V. Angelsky, Editor(s)

© SPIE. Terms of Use
Back to Top