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Proceedings Paper

Optical measuring and laser technologies for safety problems
Author(s): Yuri V. Chugui; Alexander G. Verkhogliad; Sergei N. Makarov; Evgeny V. Sysoev; Leonid V. Finogenov; Peter S. Zav'yalov; Yuri A. Lemeshko
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Paper Abstract

The novel results of the R & D activity of TDI SIE SB RAS in the field of the optical measuring and laser technologies, for solving safety problems in atomic and oil industry, as well as in railway transport are presented. 3D profilometer with submicron and nanometer resolution using Linnik white-light interferometer and testing results of industrial system for measuring surface defects of fuel elements are given. The metrological characterization of a perspective Fresnel method for high precision measuring the dimensions of objects is investigated. Results of development and testing the industrial system prototype for 3D inspection of nuclear grid spacers with micron resolution based on DOE structured illumination are presented. We have developed an optical structured light method and an optical-electronic system for automatic noncontact distant measurements of wear and defects detection for a contact wire electro-supply network. For permanent noncontact bearing position inspection of oil-drilling platforms on Sakhalin coast (Russia) we have developed optical-electronic method and produce system SAKHALIN. Experimental results and technical performances are presented.

Paper Details

Date Published: 22 April 2008
PDF: 15 pages
Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081L (22 April 2008); doi: 10.1117/12.797101
Show Author Affiliations
Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering (Russia)
Alexander G. Verkhogliad, Technological Design Institute of Scientific Instrument Engineering (Russia)
Sergei N. Makarov, Technological Design Institute of Scientific Instrument Engineering (Russia)
Evgeny V. Sysoev, Technological Design Institute of Scientific Instrument Engineering (Russia)
Leonid V. Finogenov, Technological Design Institute of Scientific Instrument Engineering (Russia)
Peter S. Zav'yalov, Technological Design Institute of Scientific Instrument Engineering (Russia)
Yuri A. Lemeshko, Technological Design Institute of Scientific Instrument Engineering (Russia)


Published in SPIE Proceedings Vol. 7008:
Eighth International Conference on Correlation Optics

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