Share Email Print
cover

Proceedings Paper

The impact of radiation hardened by design (RHBD) techniques on the performance of readout integrated circuits in radiation environments
Author(s): John E. Hubbs; Mark E. Gramer; Diana Maestas-Jepson; Gary A. Dole; Allan Hahn
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The tolerance of a hybrid array (HA) to total ionizing dose (TID) radiation continues to be a major performance consideration for space based imaging systems. In an effort to improve TID performance, HA manufacturers have begun to utilize circuit design techniques to enhance the TID tolerance of readout integrated circuits (ROICs). This paper will report on the radiometric and TID radiation characterizations of a HA that utilizes radiation-hardened-by-design (RHBD) techniques. This paper will not describe the design techniques used. Instead, characterization data are presented that demonstrate a HA TID tolerance of over 25 units of total ionizing dose (UTID). This result is compared with the performance of devices with ROICs processed at commercial foundries that do not make use of RHBD techniques. The HA described in this paper represents a state-of-the-art device; the ROIC was designed to be low noise, high gain, and radiation tolerant. While design techniques were utilized to enhance its TID hardness, no special fabrication processes were used.

Paper Details

Date Published: 26 August 2008
PDF: 12 pages
Proc. SPIE 7095, Nanophotonics and Macrophotonics for Space Environments II, 70950E (26 August 2008); doi: 10.1117/12.796871
Show Author Affiliations
John E. Hubbs, Air Force Research Lab. (United States)
Mark E. Gramer, Air Force Research Lab. (United States)
Diana Maestas-Jepson, Air Force Research Lab. (United States)
Gary A. Dole, Air Force Research Lab. (United States)
Allan Hahn, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 7095:
Nanophotonics and Macrophotonics for Space Environments II
Edward W. Taylor; David A. Cardimona, Editor(s)

© SPIE. Terms of Use
Back to Top