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Proceedings Paper

Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition
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Paper Abstract

The speckle that is formed in coherent illumination confuses efforts to record an object's fine details. The confusion is particularly severe in optical metrology and microscopy. In this paper, a scheme using the empirical mode decomposition (EMD) to remove speckles is proposed. This makes it possible to accurately evaluate phases from a fringe pattern illuminated by a coherent light source.

Paper Details

Date Published: 25 August 2008
PDF: 11 pages
Proc. SPIE 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II, 70561Q (25 August 2008); doi: 10.1117/12.796697
Show Author Affiliations
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)
Chao-Kuei Lee, National Sun Yat-Sen Univ. (Taiwan)
Cheng-Wei Lee, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 7056:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II
Shizhuo Yin; Ruyan Guo, Editor(s)

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