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Proceedings Paper

Investigation of polycrystalline structure of CVD diamond using white-beam x-ray diffraction
Author(s): Alexey Souvorov; Kentaro Kajiwara; Hiroaki Kimura; Shunji Goto; Tetsuya Ishikawa
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Paper Abstract

Polycrystalline structure of a chemical vapor deposited (CVD) diamond vacuum window was investigated by means of white-beam diffraction. Forward Laue diffraction patterns were recorded using two-dimensional flat panel sensor. A computer aided approximate indexation of the Laue spots was performed based on maximum correlation between observed and directly simulated patterns. Different sets of the diffraction patterns were attributed to the different diamond crystalline grains. Retrieved orientations of the illuminated grains were rather random and average linear dimension of the single grain was about 56-64 μm.

Paper Details

Date Published: 3 September 2008
PDF: 6 pages
Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770N (3 September 2008); doi: 10.1117/12.796683
Show Author Affiliations
Alexey Souvorov, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Kentaro Kajiwara, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Hiroaki Kimura, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Shunji Goto, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Tetsuya Ishikawa, SPring-8/RIKEN (Japan)


Published in SPIE Proceedings Vol. 7077:
Advances in X-Ray/EUV Optics and Components III
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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