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Proceedings Paper

Measurement method of optical scatter using a STAR GEM as a scatterometer
Author(s): Etsuo Kawate
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Paper Abstract

A STAR GEM as a scatterometer can measure diffuse reflection spectra. The acronym of STAR GEM is from the capital letters of Scatter, Transmission, and Absolute Reflection measurements using a Geminated Ellipsoid Mirror. A biconical accessory, such as the STAR GEM, has the advantage that it has very high collection efficiency and the ability to measure scattered reflected light from very small samples. However, it is generally thought of as a qualitative device. It becomes clear that the STAR GEM is superior to a goniometer on the study to measure absolute reflectance of a specular sample. Only the goniometer and its family can quantitatively measure the bidirectional reflectance distribution function (BRDF) of a sample. The purpose of this paper is to describe the possibilities and problems for the STAR GEM to measure the BRDF of a sample.

Paper Details

Date Published: 29 August 2008
PDF: 9 pages
Proc. SPIE 7065, Reflection, Scattering, and Diffraction from Surfaces, 706515 (29 August 2008); doi: 10.1117/12.796599
Show Author Affiliations
Etsuo Kawate, National Institute of Advanced Industrial Science and Technology (Japan)
TRAS Inc. (Japan)


Published in SPIE Proceedings Vol. 7065:
Reflection, Scattering, and Diffraction from Surfaces
Zu-Han Gu; Leonard M. Hanssen, Editor(s)

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