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Proceedings Paper

High spatial resolution x-ray mapping of CdZnTe detectors
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Paper Abstract

CdZnTe (CZT) is the most promising semiconductor for room-temperature nuclear radiation detectors. At Brookhaven's National Synchrotron Light Source (NSLS), we used a highly collimated synchrotron X-ray radiation to map different CZT detectors. In this paper, the latest results from high spatial resolution X-ray mapping of CZT detectors are reported. Effects of different internal defects on the performance of CZT detectors are discussed.

Paper Details

Date Published: 5 September 2008
PDF: 10 pages
Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70791D (5 September 2008); doi: 10.1117/12.796595
Show Author Affiliations
G. Yang, Brookhaven National Lab. (United States)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
G. S. Camarda, Brookhaven National Lab. (United States)
Y. Cui, Brookhaven National Lab. (United States)
A. Hossain, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 7079:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

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