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Proceedings Paper

Polarization measurements made on LFRA and OASIS emitter arrays
Author(s): Jon Geske; Kevin Sparkman; Jim Oleson; Joe Laveigne; Breck Sieglinger; Steve Marlow; Heard Lowry; James Burns
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Paper Abstract

Polarization is increasingly being considered as a method of discrimination in passive sensing applications. In this paper the degree of polarization of the thermal emission from the emitter arrays of two new Santa Barbara Infrared (SBIR) micro-bolometer resistor array scene projectors was characterized at ambient temperature and at 77 K. The emitter arrays characterized were from the Large Format Resistive Array (LFRA) and the Optimized Arrays for Space-Background Infrared Simulation (OASIS) scene projectors. This paper reports the results of this testing.

Paper Details

Date Published: 24 April 2008
PDF: 11 pages
Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420L (24 April 2008); doi: 10.1117/12.796421
Show Author Affiliations
Jon Geske, Aerius Photonics, LLC (United States)
Kevin Sparkman, Santa Barbara Infrared, Inc. (United States)
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Joe Laveigne, Santa Barbara Infrared, Inc. (United States)
Breck Sieglinger, MacAulay-Brown Inc.,/KHILS (United States)
Steve Marlow, MacAulay-Brown Inc.,/KHILS (United States)
Heard Lowry, Arnold Engineering Development Ctr. (United States)
James Burns, Arnold Engineering Development Ctr. (United States)


Published in SPIE Proceedings Vol. 6942:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
Robert Lee Murrer, Editor(s)

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