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Proceedings Paper

An optical accessory for absolute reflection and transmission measurements in the wavelength region from 0.24&mgr;m to 25&mgr;m
Author(s): Etsuo Kawate
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Paper Abstract

Five methods for the measurement of absolute reflectance are described and compared. Four of the methods, the V-W, V-N, integrating sphere and goniometer methods, have been in use for a number of years. The fifth is a new STAR GEM method. The acronym of STAR GEM is from the capital letters of Scatter, Transmission, and Absolute Reflection measurements using a Geminated Ellipsoid Mirror. Only the goniometer and STAR GEM methods can be used to measure reflectance and transmittance at almost any angle of incidence. The STAR GEM is used in conjunction with an FTIR (Fourier-Transform Infrared) spectrophotometer and also with a grating spectrophotometer to make reflectance and transmittance measurements in the wavelength region from 0.24&mgr;m to 25&mgr;m. Ordinate errors of the FTIR spectrophotometer are estimated from measurements in the overlapping wavelength region made by both spectrophotometers. A reflectance measurement of a non-plane surface, such as a surface of micro-ball lenses, can also be made using the STAR GEM.

Paper Details

Date Published: 29 August 2008
PDF: 11 pages
Proc. SPIE 7065, Reflection, Scattering, and Diffraction from Surfaces, 70650M (29 August 2008); doi: 10.1117/12.796397
Show Author Affiliations
Etsuo Kawate, National Institute of Advanced Industrial Science and Technology (Japan)

Published in SPIE Proceedings Vol. 7065:
Reflection, Scattering, and Diffraction from Surfaces
Zu-Han Gu; Leonard M. Hanssen, Editor(s)

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