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Proceedings Paper

The structural and material properties of CuInSe2 and Cu (In,Ga)Se2 prepared by selenization of stacks of metal and compound precursors by Se vapor for solar cell applications
Author(s): F. B. Dejene
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Paper Abstract

CuInse2 films and related alloys were prepared by thermal evaporation of Cu, InSe and GaSe compounds instead of elemental sources. Band gap tailoring in Cu(In,Ga)Se2 based solar cells is an interesting path to improve their performance. In order to get comparable results solar cells with Ga/(In+Ga) ratios x =0 and 0.3 were prepared, all with a simple two-step sequential evaporation process. The morphology of the resulting films grown at 550°C was characterized by the presence of large facetted chalcopyrite grains, which are typical for device quality material. It is important to note that absorber films with elemental gallium resulted in a significant decrease in the average grain size of the film. The XRD diffraction pattern of a single-phase Cu(In,Ga)Se2 films depicts diffraction peaks shift to higher 2θ values compared to that of pure CuInSe2 . The PL spectrum of Cu(In,Ga)Se2 thin films also depicts the presence of the peak at higher energy that is attributed to the incorporation of gallium into the chalcopyrite lattice. As the band gap of CIGS increases with gallium content, desirable effects of producing higher open-circuit voltage and low-current density devices were achieved. A corresponding increase in device efficiency with gallium content caused by a higher fill factor was observed. The best results show passive area efficiencies of up to 10.2% and open circuit voltage (Voc) up to 519 mV at a minimum band gap of 1.18eV.

Paper Details

Date Published: 10 September 2008
PDF: 9 pages
Proc. SPIE 7045, Photovoltaic Cell and Module Technologies II, 70450H (10 September 2008); doi: 10.1117/12.796381
Show Author Affiliations
F. B. Dejene, Univ. of the Free State (South Africa)


Published in SPIE Proceedings Vol. 7045:
Photovoltaic Cell and Module Technologies II
Bolko von Roedern; Alan E. Delahoy, Editor(s)

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