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Proceedings Paper

Analysis of silver columnar thin films by atomic force microscopy
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Paper Abstract

Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

Paper Details

Date Published: 10 September 2008
PDF: 7 pages
Proc. SPIE 7041, Nanostructured Thin Films, 704112 (10 September 2008); doi: 10.1117/12.796212
Show Author Affiliations
Fatima Benkabou, Univ. de Moncton (Canada)
Akhlesh Lakhtakia, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 7041:
Nanostructured Thin Films
Geoffrey B. Smith; Akhlesh Lakhtakia, Editor(s)

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