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Proceedings Paper

An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures
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Paper Abstract

An instrument, the Complete Hemispherical Infrared Laser-based Reflectometer (CHILR), has been designed and built for the accurate characterization of the total reflectance of highly absorbing samples and cavity structures down to the level of 10-5. The design of CHILR employs a number of the same features of Total Integrated Scatter (TIS) measurement devices, but is used for total reflectance (both specular and diffuse components), rather than only the diffuse component. A number of features of CHILR include spatial uniformity and angular dependence of reflectance measurement capability, multiple wavelength laser sources, and the ability to measure a wide range of sample sizes and cavities with aperture sizes, ranging from 3 mm to 51 mm. We address several basic issues of alignment, background and externally scattered light, reference measurement, and laser drift, for the CHILR. We also present results of several examples, including cavities for blackbody sources, and radiometer cavities.

Paper Details

Date Published: 29 August 2008
PDF: 12 pages
Proc. SPIE 7065, Reflection, Scattering, and Diffraction from Surfaces, 70650F (29 August 2008); doi: 10.1117/12.796186
Show Author Affiliations
Jinan Zeng, National Institute of Standards and Technology (United States)
Leonard Hanssen, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 7065:
Reflection, Scattering, and Diffraction from Surfaces
Zu-Han Gu; Leonard M. Hanssen, Editor(s)

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