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Proceedings Paper

Beam profiling at focus: essential for beam shaping
Author(s): Lawrence I. Green
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Paper Abstract

Spatial laser beam profiling at focus is an essential part of quantitatively characterizing the shaped laser beam. We will discuss new methods that can profile almost any laser at almost any power level.

Paper Details

Date Published: 11 September 2008
PDF: 11 pages
Proc. SPIE 7062, Laser Beam Shaping IX, 70620G (11 September 2008); doi: 10.1117/12.796025
Show Author Affiliations
Lawrence I. Green, Ophir-Spiricon, Inc. (United States)


Published in SPIE Proceedings Vol. 7062:
Laser Beam Shaping IX
Andrew Forbes; Todd E. Lizotte, Editor(s)

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