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Proceedings Paper

PV reliability determination from I-V measurement and analysis
Author(s): K. Emery
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Paper Abstract

We discuss the measurement and analysis of current vs. voltage (I-V) characteristics of photovoltaic (PV) cells and modules for reliability determination. We discuss both the error sources in the measurements and the strategies to minimize their influence. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing issues. Information that can be extracted from light and dark I-V includes peak power, open-circuit voltage, short-circuit current, series and shunt resistance, diode quality factor, dark current, and photo-current. The quantum efficiency provides information on photo-current nonlinearities, current generation and recombination mechanisms.

Paper Details

Date Published: 28 August 2008
PDF: 7 pages
Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 704803 (28 August 2008); doi: 10.1117/12.795965
Show Author Affiliations
K. Emery, National Renewable Energy Lab. (United States)


Published in SPIE Proceedings Vol. 7048:
Reliability of Photovoltaic Cells, Modules, Components, and Systems
Neelkanth G. Dhere, Editor(s)

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