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Proceedings Paper

In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale
Author(s): Andrei Y. Nikulin; Aliaksandr V. Darahanau; Ruben A. Dilanian; Barry C. Muddle; Alexei Y. Souvorov; Osami Sakata
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Paper Abstract

High-angular-resolution Fraunhofer diffraction data were collected from several samples with interfaces between dissimilar metals and an artificial crack in a metal foil using synchrotron x-radiation. The refractive index profile in the vicinity of the interface and crack of each sample was reconstructed with spatial resolution of about 40-60 nm by the Phase Retrieval X-Ray Diffractometry technique, using only limited a priori knowledge of the sample. These studies have demonstrated the viability of the technique as an in-situ nondestructive method of characterization of internal interfaces within multiphase materials and crack developing under external force.

Paper Details

Date Published: 18 September 2008
PDF: 12 pages
Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70781M (18 September 2008); doi: 10.1117/12.795952
Show Author Affiliations
Andrei Y. Nikulin, Monash Univ. (Australia)
Aliaksandr V. Darahanau, Monash Univ. (Australia)
Ruben A. Dilanian, Monash Univ. (Australia)
Barry C. Muddle, Monash Univ. (Australia)
Alexei Y. Souvorov, JASRI/SPring-8 (Japan)
Osami Sakata, JASRI/SPring-8 (Japan)


Published in SPIE Proceedings Vol. 7078:
Developments in X-Ray Tomography VI
Stuart R. Stock, Editor(s)

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