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Proceedings Paper

A theoretical study of two-dimensional point focusing by two multilayer Laue lenses
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Paper Abstract

Hard x-ray point focusing by two crossed multilayer Laue lenses is studied using a full-wave modeling approach. This study shows that for a small numerical aperture, the two consecutive diffraction processes can be decoupled into two independent ones in respective directions. Using this theoretical tool, we investigate adverse effects of various misalignments on the 2D focus profile and discuss the tolerance to them. We also derive simple expressions that describe the required alignment accuracy.

Paper Details

Date Published: 3 September 2008
PDF: 8 pages
Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770Q (3 September 2008); doi: 10.1117/12.795721
Show Author Affiliations
Hanfei Yan, Brookhaven National Lab. (United States)
Argonne National Lab. (United States)
Jorg Maser, Argonne National Lab. (United States)
Hyon Chol Kang, Argonne National Lab. (United States)
Gwangju Institute of Science and Technology (Korea, Republic of)
Albert Macrander, Argonne National Lab. (United States)
Brian Stephenson, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 7077:
Advances in X-Ray/EUV Optics and Components III
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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