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Proceedings Paper

Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer
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Paper Abstract

Frequently two-dimensional interferograms are obtained when a point-diffraction interferometer (PDI) is used in optical testing. The PDI is a simple, convenient and robust tool for optical shop testing. In this paper, we propose the use of the PDI and placing a slit at the exit pupil to scanning the surface under test. Stitching is then used to generate a phase map of the test wavefront. The advantage of the proposal is the sharpness of the fringes to obtain high resolution contour of the test wavefront, we describe the method and some experimental results.

Paper Details

Date Published: 11 August 2008
PDF: 7 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706315 (11 August 2008); doi: 10.1117/12.795582
Show Author Affiliations
Luis Rodríguez-Castillo, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Fermín S. Granados-Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Alejandro Cornejo-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)

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