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Proceedings Paper

Diffraction imaging with conventional sources
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Paper Abstract

X ray diffraction reveals the nanoscale structure of both tissue and inorganic materials. Different materials can be distinguished and mapped by collecting the diffracted rays at different angles. Conventional diffraction measurements require a pencil beam and hence a small sample area to measure an accurate diffraction angle, so producing a mapped image requires a two dimensional scan. In order to to shorten the collection time for large areas, a slit system was developed. An antiscatter grid was placed in front of the detector to select the desired diffraction angle. This device can potentially be used in a scanning system to map the presence of target materials or in diagnostic radiology to detect cancerous tissues.

Paper Details

Date Published: 22 September 2008
PDF: 8 pages
Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770K (22 September 2008); doi: 10.1117/12.795383
Show Author Affiliations
Wei Zhou, Univ. at Albany (United States)
C. A. MacDonald, Univ. at Albany (United States)

Published in SPIE Proceedings Vol. 7077:
Advances in X-Ray/EUV Optics and Components III
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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