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Proceedings Paper

Final surface treatment effect on performance of CdZnTe Frisch collar gamma-ray detectors
Author(s): Alireza Kargar; Adam C. Brooks; Kyle T. Kohman; Rans B. Lowell; Roger C. Keyes; Henry Chen; Salah Awadalla; Glenn Bindley; Douglas S. McGregor
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Paper Abstract

Surface passivation and final surface treatment on the lateral sides of CdZnTe/CdTe gamma ray detectors have been studied by many research groups. However, systematic studies of spectroscopic performance and the current voltage (I-V) characteristic behavior of devices as a result of surface treatments have not been conducted. Additionally, few studies report results for high energy gamma ray detection, which requires different techniques and technologies. In this study, a variety of final surface treatments and oxidizing agents have been applied on different CdZnTe detectors, and the effects on the I-V characteristic behavior and spectral performance of Frisch collar devices at 662 keV are reported. Further, the possibility of an alternative method is investigated, in which ion milling is utilized to etch the lateral surfaces with energetic ions of Xenon. The process is described in detail and the challenges are presented. Electron Microprobe (EMP) technique was performed on the device sides to determine the surface elements using Energy Dispersive Spectroscopy (EDS) before and after each treatment. The CdZnTe materials for this study were acquired from Redlen Technologies, and the CdZnTe devices were fabricated and characterized for each treatment at the S.M.A.R.T. Laboratory at Kansas State University.

Paper Details

Date Published: 4 September 2008
PDF: 12 pages
Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70790B (4 September 2008); doi: 10.1117/12.795366
Show Author Affiliations
Alireza Kargar, Kansas State Univ. (United States)
Adam C. Brooks, Kansas State Univ. (United States)
Kyle T. Kohman, Kansas State Univ. (United States)
Rans B. Lowell, Kansas State Univ. (United States)
Roger C. Keyes, Kansas State Univ. (United States)
Henry Chen, Redlen Technologies (Canada)
Salah Awadalla, Redlen Technologies (Canada)
Glenn Bindley, Redlen Technologies (Canada)
Douglas S. McGregor, Kansas State Univ. (United States)


Published in SPIE Proceedings Vol. 7079:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

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