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Proceedings Paper

Reliability of pixellated CZT detector modules used for medical imaging and homeland security
Author(s): H. Chen; S. A. Awadalla; F. Harris; P. H. Lu; G. Bindley; H. Lenos; B. Cardoso
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Paper Abstract

Long term reliability is critical for a detector module to be used in applications that can not afford failure and require high accuracy such as medical imaging and homeland security. In this study, we report the reliability of pixellated Cadmium Zinc Telluride (CZT) detector modules fabricated from crystals grown by the Traveling Heater Method (THM). The reliability of the module which consists of the pixellated detector assembled to a PCB carrier board via conductive epoxy was studied with both a Quantitative Accelerated Life Test (QALT) as well as the Highly Accelerated Stress Test (HAST) which is a common form of a Qualitative Accelerated Life test. The robustness of the THM pixellated CZT detector modules is demonstrated via the pre- and post- accelerated life test comparison of the leakage current and the spectral performance of the assembled module. A shear test was also used to ensure the adhesion strength of the epoxy bonded method. To our knowledge, this type of study on pixellated CZT detector module has been very rare if not the first of its kind.

Paper Details

Date Published: 10 September 2008
PDF: 10 pages
Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 707905 (10 September 2008); doi: 10.1117/12.795252
Show Author Affiliations
H. Chen, Redlen Technologies (Canada)
S. A. Awadalla, Redlen Technologies (Canada)
F. Harris, Redlen Technologies (Canada)
P. H. Lu, Redlen Technologies (Canada)
G. Bindley, Redlen Technologies (Canada)
H. Lenos, Aguila Technologies (United States)
B. Cardoso, Aguila Technologies (United States)

Published in SPIE Proceedings Vol. 7079:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

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