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Proceedings Paper

Coating induced phase aberration in a Schwarzschild objective
Author(s): Samad Edlou; Lan Sun; Chuck Synborski
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Paper Abstract

Phase aberration induced by optical coatings can be a critical factor in image quality. When multilayer thin film high reflectors are used at oblique incidence, the two planes of polarization for the most part have different phase shift. This difference is known as phase retardance and is a function of the angle of incidence, coating design, and the spectral wavelength. Point spread function (PSF) calculation by geometrical ray tracing shows the phase aberration caused by the coating could influence the resolution of the lens system. In this paper we investigate phase retardance of three high reflector coating types and their impact on the final image quality in a Schwarzschild objective.

Paper Details

Date Published: 29 August 2008
PDF: 10 pages
Proc. SPIE 7067, Advances in Thin-Film Coatings for Optical Applications V, 706709 (29 August 2008); doi: 10.1117/12.795241
Show Author Affiliations
Samad Edlou, CVI Melles Griot (United States)
Lan Sun, CVI Melles Griot (United States)
Chuck Synborski, CVI Melles Griot (United States)

Published in SPIE Proceedings Vol. 7067:
Advances in Thin-Film Coatings for Optical Applications V
Jennifer D. T. Kruschwitz; Michael J. Ellison, Editor(s)

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