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Proceedings Paper

Optimum wavelength selection for the method of excess fractions
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Paper Abstract

In this paper, we present an understanding of the failure modes of excess fractions solutions to multi-wavelength interferometry. From this basis, an approach to select optimum measurement wavelengths has been introduced. A practical fiber optic sensor has been constructed for simultaneous detection of the intensity at four measurement wavelengths. The system has been demonstrated using two wavelength selections that are very near the optimal configuration and the data analyzed using an excess fractions solver. Initial results have shown a measurement range of 17 mm with reliable and robust absolute metrology from a system with a phase noise of 1/200th of a fringe. This corresponds to an overall dynamic range of 1 part in 2×106.

Paper Details

Date Published: 11 August 2008
PDF: 9 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 70630V (11 August 2008); doi: 10.1117/12.795211
Show Author Affiliations
Konstantinos Falaggis, Univ. of Leeds (United Kingdom)
David P. Towers, Univ. of Leeds (United Kingdom)
Catherine E. Towers, Univ. of Leeds (United Kingdom)

Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)

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