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Proceedings Paper

Measuring chromatic dispersion using single-arm interferometers: from millimeters to kilometers
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Paper Abstract

We present three new interferometric techniques for dispersion characterization covering from millimeter waveguides to kilometers of fibers. The first is a Frequency-Shifted Interferometer (FSI) that measures fibers from meters to tens of kilometers. The second is a three-wave Single-Arm Interferometer (SAI), where the envelope of a three-wave interference pattern yields the second-order dispersion directly. It is suitable for fibers from centimeters to >1m. The third is a Common-Path Interferometer (CPI) that measures dispersion of millimeter-long fibers/waveguides. These techniques offer high precision in their respective ranges, and are all "single-arm" interferometers: the two interfering beams go through the same arm of the interferometer. They are simple, low-cost, and more resilient to phase and polarization instabilities than conventional interferometric techniques for dispersion measurement.

Paper Details

Date Published: 3 September 2008
PDF: 13 pages
Proc. SPIE 7072, Optics and Photonics for Information Processing II, 70720D (3 September 2008); doi: 10.1117/12.795103
Show Author Affiliations
Li Qian, Univ. of Toronto (Canada)
Bing Qi, Univ. of Toronto (Canada)
Waleed S. Mohammed, Univ. of Toronto (Canada)
Michael A. Galle, Univ. of Toronto (Canada)
Fei Ye, Univ. of Toronto (Canada)

Published in SPIE Proceedings Vol. 7072:
Optics and Photonics for Information Processing II
Abdul Ahad Sami Awwal; Khan M. Iftekharuddin; Bahram Javidi, Editor(s)

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