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Proceedings Paper

Statistical data analysis of thin film photovoltaic modules deployed in hot and humid climate of Florida
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Paper Abstract

Current accelerated tests of photovoltaic (PV) modules mostly prevent infant mortality but cannot duplicate changes occurring in the field nor can predict useful lifetime. Therefore, monitoring of field-deployed PV modules was undertaken at FSEC with goals to assess their performance in hot and humid climate under high voltage operation and to correlate the PV performance with the meteorological parameters. This paper presents performance analysis of U.S. Company manufactured thin film a-Si:H PV modules that are encapsulated using flexible front sheets and framed to be outdoor tested. Statistical data analysis of PV parameters along with meteorological parameters, monitored continuously, is carried out on regular basis with PVUSA type regression analysis. Current-voltage (I-V) characteristic of module arrays that are obtained periodically complement the continuous data monitoring. Moreover, effect of high voltage bias and ambient parameters on leakage current in PV modules on individual modules is studied. Any degradation occurring during initial 18 months could not be assessed due to data acquisition and hurricane problems. No significant degradation was observed in the performance of PV modules during the subsequent 30-months. It is planned to continue this study for a prolonged period so as to serve as basis for their long-term warranties.

Paper Details

Date Published: 10 September 2008
PDF: 8 pages
Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 70480T (10 September 2008); doi: 10.1117/12.795009
Show Author Affiliations
Shirish A. Pethe, Univ. of Central Florida (United States)
Ashwani Kaul, Univ. of Central Florida (United States)
Neelkanth G. Dhere, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 7048:
Reliability of Photovoltaic Cells, Modules, Components, and Systems
Neelkanth G. Dhere, Editor(s)

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