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Proceedings Paper

Scene-based wavefront correction with spatial light modulators
Author(s): Tobias Haist; Jan Hafner; Michael Warber; Wolfgang Osten
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Paper Abstract

Spatial light modulators (SLM) are used in different microscopy setups. Examples are optical tweezers, programmable phase contrast imaging, confocal imaging, and aberration correction. We report on a method that measures and corrects specimen-induced aberrations in wide-field microscopy without additional optical components (e.g. Shack-Hartmann sensors) by taking advantage of the SLM that is already used in the setup. Different local gratings are written into the SLM which is positioned in a plane conjugate to the pupil of the imaging system. Multiple images are recorded and based on the shift of subimages we deduce the wavefront. We demonstrate first experimental results of this method for a system using a high resolution LCoS modulator.

Paper Details

Date Published: 11 August 2008
PDF: 11 pages
Proc. SPIE 7064, Interferometry XIV: Applications, 70640M (11 August 2008); doi: 10.1117/12.794860
Show Author Affiliations
Tobias Haist, Institut für Technische Optik, Univ. Stuttgart (Germany)
Jan Hafner, Institut für Technische Optik, Univ. Stuttgart (Germany)
Michael Warber, Institut für Technische Optik, Univ. Stuttgart (Germany)
Wolfgang Osten, Institut für Technische Optik, Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 7064:
Interferometry XIV: Applications
Erik L. Novak; Wolfgang Osten; Christophe Gorecki, Editor(s)

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