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Proceedings Paper

The Finite Element Method as applied to the calculation of the quantum efficiency in optoelectronic imaging devices
Author(s): Guillaume Demésy; Frédéric Zolla; André Nicolet; Mireille Commandré; Caroline Fossati; Stéphane Ricq; Olivier Gagliano; Brendan Dunne
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Paper Abstract

We present a new formulation of the Finite Element Method (FEM) dedicated to the 2D rigorous solving of Maxwell equations adapted to the calculation of the diffracted field in optoelectronic subwavelength structures. The advantage of this method is that its implementation remains independent of the number of layers in the structure, of the number of diffractive patterns, of the geometry of the diffractive object and of the properties of the materials. The spectral response of large test photodiodes that can legitimately be represented in 2D has been measured on a dedicated optical bench and confronted to the theory. The representativeness of the model as well as the possibility of conceiving this way simply processable diffractive spectral filters are discussed.

Paper Details

Date Published: 4 September 2008
PDF: 12 pages
Proc. SPIE 7030, Nanophotonic Materials V, 70300U (4 September 2008); doi: 10.1117/12.794825
Show Author Affiliations
Guillaume Demésy, Institut Fresnel, Univ. Aix-Marseill III, École Centrale de Marseille (France)
STMicroelectronics (France)
Frédéric Zolla, Institut Fresnel, Univ. Aix-Marseill III, École Centrale de Marseille (France)
André Nicolet, Institut Fresnel, Univ. Aix-Marseill III, École Centrale de Marseille (France)
Mireille Commandré, Institut Fresnel, Univ. Aix-Marseill III, École Centrale de Marseille (France)
Caroline Fossati, Institut Fresnel, Univ. Aix-Marseill III, École Centrale de Marseille (France)
Stéphane Ricq, STMicroelectronics (France)
Olivier Gagliano, STMicroelectronics (France)
Brendan Dunne, STMicroelectronics (France)


Published in SPIE Proceedings Vol. 7030:
Nanophotonic Materials V
Zeno Gaburro; Stefano Cabrini; Dmitri Talapin, Editor(s)

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