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Proceedings Paper

Experimental measurement of surface plasmon resonance of pyramidal metal nanoparticle tips
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Paper Abstract

We report on the fabrication, experimental characterization and modeling of atomic force microscope (AFM) probes with pyramidal optical antennas fabricated at the ends of the tips. These are being developed for tip-enhanced near-field scanning optical microscopy. We use focused ion beam milling to etch a gold-coated Si3N4 AFM tip, resulting in a pyramidal gold nanoparticle (188 - 240 nm long) at the end of the tip. Using finite-difference time-domain (FDTD) simulations, we estimate the electric field distribution around the nanoparticle as a function of incident wavelength for nanoparticles of various lengths. We experimentally measure the scattering spectra of fabricated probes and show enhanced scattering associated with the localized surface plasmon resonance of the tip. Both simulations and experiments show that an increase of the tip length results in a redshift of the tip resonance wavelength. These pyramidal metal nanoparticle tips could be used for either mapping the field distribution of nanophotonic devices or high spatial resolution spectroscopy.

Paper Details

Date Published: 28 August 2008
PDF: 9 pages
Proc. SPIE 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, 70331X (28 August 2008); doi: 10.1117/12.794740
Show Author Affiliations
Yanshu Zou, Harvard School of Engineering and Applied Sciences (United States)
Kenneth B. Crozier, Harvard School of Engineering and Applied Sciences (United States)


Published in SPIE Proceedings Vol. 7033:
Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV
Satoshi Kawata; Vladimir M. Shalaev; Din Ping Tsai, Editor(s)

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