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Proceedings Paper

A defect inspection technique using polarized images for steel strip surface
Author(s): A. Kazama; T. Oshige
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Paper Abstract

An in-line defect inspection technique using polarized images for steel strip surface is developed. In inspection for low contrast defects, excessive-detection will be caused by harmless patterns such as slight oil patterns, chemical liquid patterns, and other patterns. We have adopted quasi-ellipsometric method using polarized images of the target samples to obtain their ellipsometric parameters, and found that the ellipsometric characteristics of the defects and the harmless patterns differ from each other. Based on this finding, we have developed an inspection system utilizing three polarized images with different azimuth angles to discriminate defects from harmless patterns at a high- speed production line.

Paper Details

Date Published: 3 September 2008
PDF: 9 pages
Proc. SPIE 7072, Optics and Photonics for Information Processing II, 70720L (3 September 2008); doi: 10.1117/12.794685
Show Author Affiliations
A. Kazama, JFE R&D Corp. (Japan)
T. Oshige, JFE R&D Corp. (Japan)


Published in SPIE Proceedings Vol. 7072:
Optics and Photonics for Information Processing II
Abdul Ahad Sami Awwal; Khan M. Iftekharuddin; Bahram Javidi, Editor(s)

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