Share Email Print

Proceedings Paper

Application of the dual energy technique by using a photon counting CdTe detector
Author(s): Wenjuan Zou; Takuya Nakashima; Yoshiaki Onishi; Hisashi Morii; Yoichiro Neo; Hidenori Mimura; Toru Aoki
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have proposed a new system for X-ray computed tomography (CT) scanning. By employing the dual-energy measurement, the obtained data can be used to deduce distribution images of the atomic number and electron density which are useful for identifying the scanned material. In this work, two different methods were given for the derivative process. We found method A was suitable for measuring low-Z materials while method B worked well for high-Z materials. Therefore, the two derivative methods may work complementally for material identification.

Paper Details

Date Published: 4 September 2008
PDF: 12 pages
Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70790I (4 September 2008); doi: 10.1117/12.794634
Show Author Affiliations
Wenjuan Zou, Shizuoka Univ. (Japan)
Takuya Nakashima, Shizuoka Univ. (Japan)
Yoshiaki Onishi, Shizuoka Univ. (Japan)
Hisashi Morii, Shizuoka Univ. (Japan)
Yoichiro Neo, Shizuoka Univ. (Japan)
Hidenori Mimura, Shizuoka Univ. (Japan)
Toru Aoki, Shizuoka Univ. (Japan)

Published in SPIE Proceedings Vol. 7079:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

© SPIE. Terms of Use
Back to Top