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Proceedings Paper

Surface plasmon routing in dielectric-loaded surface plasmon polariton waveguides
Author(s): J. Grandidier; S. Massenot; A. Bouhelier; G. Colas des Francs; J.-C. Weeber; L. Markey; A. Dereux
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Paper Abstract

Waveguiding by dielectric-loaded surface plasmon-polaritons (DLSPP) structures are numerically and experimentally investigated. We used the effective index model to understand the influence of basic waveguide parameters such as width and thickness on the properties of the surface plasmon guided modes. A waveguide was fabricated and experimentally studied. The effective indices of the modes supported by the waveguide and their propagation length are evaluated by leakage radiation microscopy in both the Fourier and imaging planes. Several excitation schemes were tested including surface plasmon coupling by diascopic or episcopic illumination as well as defectmediated excitation of guided modes. We found good agreement between theoretical values predicted by the effective index model and experimental values deduced from leakage radiation images.

Paper Details

Date Published: 28 August 2008
PDF: 8 pages
Proc. SPIE 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, 70330S (28 August 2008); doi: 10.1117/12.794574
Show Author Affiliations
J. Grandidier, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)
S. Massenot, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)
A. Bouhelier, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)
G. Colas des Francs, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)
J.-C. Weeber, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)
L. Markey, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)
A. Dereux, Institute Carnot de Bourgogne, UMR 5209 CNRS, Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 7033:
Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV
Satoshi Kawata; Vladimir M. Shalaev; Din Ping Tsai, Editor(s)

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