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Proceedings Paper

Robustness of photonic MEMS adaptive coded aperture imagers to technology defects and yields
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Paper Abstract

Photonic MEMS technology as it pertains to adaptive coded aperture sensing is an emerging technology offering an increase to imaging performance compared to a fixed system in the EO/IR wavelength region. In this paper we address the effects of potential manufacturing yield and defects. A 1-d first order optical model is developed in an attempt to correlate the optical/system performance to the manufacturing defects and yield output. The imager is found to be extremely robust to both random and correlated failures in the coded aperture, so long as the aperture code is adapted to the aperture failures.

Paper Details

Date Published: 19 August 2008
PDF: 8 pages
Proc. SPIE 7096, Adaptive Coded Aperture Imaging and Non-Imaging Sensors II, 70960H (19 August 2008); doi: 10.1117/12.794029
Show Author Affiliations
Oren Sternberg, Booz Allen Hamilton (United States)
Esko Jaska, Consultant (United States)


Published in SPIE Proceedings Vol. 7096:
Adaptive Coded Aperture Imaging and Non-Imaging Sensors II
David P. Casasent; Stanley Rogers, Editor(s)

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