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Proceedings Paper

The manufacturing and testing of an unrotational-symmetric SiC mirror
Author(s): Feng Yan; Di Fan; Bin-zhi Zhang; Xue-jun Zhang
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Paper Abstract

In previous work, wavefront coding technology has been applied on an off-axis three mirror anastigmatic optical system. The secondary mirror is selected as the wavefront coded element. After redesigned the surface of secondary mirror becomes an unusual unrotational-symmetric surface with cubic term, which can not be tested by traditional null testing with compensator. For preparing for manufacturing and testing this kind of elements, a simple cubic surface whose equation is z=3λ(x3 + y3) (where x, y is normalized coordinate, λ=0.6328 μm) is polished. The final surface figure is 0.327λ(PV) and 0.023λ(RMS). The manufacture of this surface is introduced in this paper. The tilt component is subtracted to minimize the material removal. Also a non-null method is described for testing the experimental element. The deviation from a reference plane of the cubic surface is regarded as system error. In another words, the ideal cubic surface is set as the reference artificially. A special system error file for interferometer can be created so that the cubic term can be extracted during the testing process automatically. The residual error is just the departure from the ideal figure of the surface under machining by this way. The error and effective range is also presented. But the method may not be practical for the secondary mirror as wavefront coded element because the surface of that kind is convex asphere added cubic term. An improved non-null method is discussed for testing this kind of surface.

Paper Details

Date Published: 11 August 2008
PDF: 12 pages
Proc. SPIE 7064, Interferometry XIV: Applications, 70640D (11 August 2008); doi: 10.1117/12.794022
Show Author Affiliations
Feng Yan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Di Fan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Bin-zhi Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xue-jun Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7064:
Interferometry XIV: Applications
Erik L. Novak; Wolfgang Osten; Christophe Gorecki, Editor(s)

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