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Proceedings Paper

Highly efficient heating assisted tip-enhanced Raman spectroscopy
Author(s): Alvarado Tarun; Norihiko Hayazawa; Masashi Motohashi; Satoshi Kawata
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Paper Abstract

We present a tip-enhanced Raman spectroscopy (TERS) system that permits efficient illumination and detection of optical properties in the visible range to obtain high contrasts Raman signals from strained silicon (ε-Si) assembled on silicon germanium substrate using an edge filter. The cut-off investigation in a depolarized TERS configuration. We overshadow wavelength of the edge filter is tuned by changing the angle of incident beam to deliver high incident power and effectively collect scattered near-field signals for nanoscopic strong far-field background signals from Raman active materials by utilizing the results obtained from depolarized surface-enhanced Raman scattering experiments in conjunction with silicon Raman tensor calculation to quantify which polarizer, analyzer and sample azimuth combination gives the minimum far-field signals. Here, we utilize the s-polarization instead of p-polarized light in conjunction with polarization properties of ε-Si to obtain a high contrast Raman signal. We found that for imaging Raman active and bulk crystalline materials such as silicon, background signal suppression (s-illumination) is more important than the field enhancement with strong far-field signal levels (p-polarization). The utilization of an edge filter for shorter collection time, depolarized configuration for higher contrast and tip heating for higher resolution are discussed.

Paper Details

Date Published: 28 August 2008
PDF: 11 pages
Proc. SPIE 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, 70330C (28 August 2008); doi: 10.1117/12.793999
Show Author Affiliations
Alvarado Tarun, RIKEN, The Institute of Physical and Chemical Research (Japan)
Norihiko Hayazawa, RIKEN, The Institute of Physical and Chemical Research (Japan)
CREST, Japan Science and Technology Agency (Japan)
Masashi Motohashi, Osaka Univ. (Japan)
Satoshi Kawata, RIKEN, The Institute of Physical and Chemical Research (Japan)
Osaka Univ. (Japan)
CREST, Japan Science and Technology Agency (Japan)


Published in SPIE Proceedings Vol. 7033:
Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV
Satoshi Kawata; Vladimir M. Shalaev; Din Ping Tsai, Editor(s)

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