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Proceedings Paper

Examining water vapor content for purging critical space systems
Author(s): Chien W. Chang; Jeffrey D. Bush; Robert R. Peabody
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Paper Abstract

This paper describes two mathematical purge models, transient and steady-state, developed for investigation of purging critical space systems with stringent humidity requirements. The developed single-cell purge model correlates well with measured data from a purge-test engineering model. The validated purge models are being used to support various purging activities/plans associated with spacecraft/payload integration and test and spacecraft/launch vehicle integration. This paper also includes a dew-point analysis to address water-vapor condensation concern for purging critical space systems.

Paper Details

Date Published: 2 September 2008
PDF: 10 pages
Proc. SPIE 7069, Optical System Contamination: Effects, Measurements, and Control 2008, 70690H (2 September 2008); doi: 10.1117/12.793884
Show Author Affiliations
Chien W. Chang, Lockheed Martin Space Systems Co. (United States)
Jeffrey D. Bush, Lockheed Martin Space Systems Co. (United States)
Robert R. Peabody, Lockheed Martin Space Systems Co. (United States)


Published in SPIE Proceedings Vol. 7069:
Optical System Contamination: Effects, Measurements, and Control 2008
Sharon A. Straka, Editor(s)

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