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Proceedings Paper

Validity of a fully coherent field model for in-line x-ray phase imaging
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Paper Abstract

Accurate models that describe the propagation of partially coherent wave fields and their interaction with refractive index inhomogeneities within a sample are required to optimally design X-ray phase-contrast imaging systems. Several methods have been proposed for the direct propagation of the second-order statistical properties of a wave field. One method, which has been demonstrated for x-ray microscopy, employs a single eikonal for propagation, approximating the phase by an average over the temporal Fourier components of the field. We have revisited this method by use of a coherent mode model from classic coherence theory. Our analysis produces a variant of the transport of intensity equation for partially coherent wave fields.

Paper Details

Date Published: 17 September 2008
PDF: 6 pages
Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70781A (17 September 2008); doi: 10.1117/12.793872
Show Author Affiliations
Adam M. Zysk, Illinois Institute of Technology (United States)
Miles N. Wernick, Illinois Institute of Technology (United States)
Mark A. Anastasio, Illinois Institute of Technology (United States)


Published in SPIE Proceedings Vol. 7078:
Developments in X-Ray Tomography VI
Stuart R. Stock, Editor(s)

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