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Proceedings Paper

Improved spectral response model for backside illuminated photovoltaic devices
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Paper Abstract

Backside illuminated detectors are sometimes fabricated on a thick substrates. In this work, we have calculated detector spectral response using the stack matrix approach. This matrix formulation first constructs a 2x2 "Stack Matrix" S that describes the optical properties of the complete stack from the detailed optical properties (as a function of wavelength) of each layer in the entire stack. The stack matrix relates the electric field strengths of the electromagnetic wave at the left of the stack to the electric field strengths of the electromagnetic waves at the right of the stack. The stack matrix S is constructed from the multiplication of matrices that track the phase and amplitude of the waves propagating across interfaces and from one side of a layer to the other side. From the detailed optical properties (as a function of wavelength) of each material layer, spectral response was calculated.

Paper Details

Date Published: 3 September 2008
PDF: 7 pages
Proc. SPIE 7055, Infrared Systems and Photoelectronic Technology III, 70550D (3 September 2008); doi: 10.1117/12.793820
Show Author Affiliations
Priyalal S. Wijewarnasuriya, Army Research Lab. (United States)
M. G. Stapelbroek, DRS Sensors & Targeting Systems, Inc. (United States)
A. I. D'Souza, DRS Sensors & Targeting Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 7055:
Infrared Systems and Photoelectronic Technology III
Eustace L. Dereniak; John P. Hartke; Paul D. LeVan; Randolph E. Longshore; Ashok K. Sood, Editor(s)

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