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Proceedings Paper

Hierarchical multimodal tomographic x-ray imaging at a superbend
Author(s): M. Stampanoni; F. Marone; G. Mikuljan; K. Jefimovs; P. Trtik; J. Vila-Comamala; C. David; R. Abela
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Paper Abstract

Over the last decade, synchrotron-based X-ray tomographic microscopy has established itself as a fundamental tool for non-invasive, quantitative investigations of a broad variety of samples, with application ranging from space research and materials science to biology and medicine. Thanks to the brilliance of modern third generation sources, voxel sizes in the micrometer range are routinely achieved by the major X-ray microtomography devices around the world, while the isotropic 100 nm barrier is reached and trespassed only by few instruments. The beamline for TOmographic Microscopy and Coherent rAdiology experiments (TOMCAT) of the Swiss Light Source at the Paul Scherrer Institut, operates a multimodal endstation which offers tomographic capabilities in the micrometer range in absorption contrast - of course - as well as phase contrast imaging. Recently, the beamline has been equipped with a full field, hard X-rays microscope with a theoretical pixel size down to 30 nm and a field of view of 50 microns. The nanoscope performs well at X-ray energies between 8 and 12 keV, selected from the white beam of a 2.9 T superbend by a [Ru/C]100 fixed exit multilayer monochromator. In this work we illustrate the experimental setup dedicated to the nanoscope, in particular the ad-hoc designed X-ray optics needed to produce a homogeneous, square illumination of the sample imaging plane as well as the magnifying zone plate. Tomographic reconstructions at 60 nm voxel size will be shown and discussed.

Paper Details

Date Published: 17 September 2008
PDF: 11 pages
Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70780V (17 September 2008); doi: 10.1117/12.793759
Show Author Affiliations
M. Stampanoni, Paul Scherrer Institut (Switzerland)
ETH Zürich (Switzerland)
F. Marone, Paul Scherrer Institut (Switzerland)
G. Mikuljan, Paul Scherrer Institut (Switzerland)
K. Jefimovs, Swiss Federal Labs. for Material Testing and Research (Switzerland)
P. Trtik, Swiss Federal Labs. for Material Testing and Research (Switzerland)
J. Vila-Comamala, Paul Scherrer Institut (Switzerland)
C. David, Paul Scherrer Institut (Switzerland)
R. Abela, Paul Scherrer Institut (Switzerland)

Published in SPIE Proceedings Vol. 7078:
Developments in X-Ray Tomography VI
Stuart R. Stock, Editor(s)

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