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Proceedings Paper

Sensitivity of x-ray phase tomography based on Talbot and Talbot-Lau interferometer
Author(s): Atsushi Momose; Wataru Yashiro; Yoshihiro Takeda; Norihide Maikusa
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Paper Abstract

The sensitivity of X-ray phase tomography based on Talbot(-Lau) interferometry is discussed. A criterion is described to evaluate the superiority of the technique in comparison to the conventional absorption-contrast method. An experimental result of X-ray phase tomography with a Talbot interferometer is compared with the criterion. The advantage of X-ray phase tomography based on Talbot(-Lau) interferometry is more prominent when smaller structures are observed with smaller pixels.

Paper Details

Date Published: 17 September 2008
PDF: 8 pages
Proc. SPIE 7078, Developments in X-Ray Tomography VI, 707811 (17 September 2008); doi: 10.1117/12.792953
Show Author Affiliations
Atsushi Momose, The Univ. of Tokyo (Japan)
Wataru Yashiro, The Univ. of Tokyo (Japan)
Yoshihiro Takeda, The Univ. of Tokyo (Japan)
Norihide Maikusa, The Univ. of Tokyo (Japan)


Published in SPIE Proceedings Vol. 7078:
Developments in X-Ray Tomography VI
Stuart R. Stock, Editor(s)

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