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Proceedings Paper

Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach
Author(s): Wojtek J. Walecki; Fanny Szondy
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Paper Abstract

We report a new system for measurement of the spatially resolved quantum efficiency (QE) of the semiconductor solarcells. In our method solar-cell is illuminated by modified liquid crystal display projector scanner. System allows to measure photo-current, and optical properties of the illuminated surface. The same system can be also used to measure surface topography of the wafer, its bow, and warp, and calculate lateral stress in the structure if structure cross-section is known.

Paper Details

Date Published: 10 September 2008
PDF: 6 pages
Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 704804 (10 September 2008); doi: 10.1117/12.792934
Show Author Affiliations
Wojtek J. Walecki, Sunrise Optical LLC (United States)
Fanny Szondy, Sunrise Optical LLC (United States)

Published in SPIE Proceedings Vol. 7048:
Reliability of Photovoltaic Cells, Modules, Components, and Systems
Neelkanth G. Dhere, Editor(s)

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