Share Email Print
cover

Proceedings Paper

Adaptive MWIR spectral imaging sensor
Author(s): F. D. Shepherd; J. M. Mooney; T. E. Reeves; P. Dumont; M. M. Weeks; S. DiSalvo
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An MWIR spectral imaging sensor based on dual direct vision prism (DVP) architecture is described. This sensor represents a third generation of the Chromotomographic Hyperspectral Imaging Sensor (CTHIS). In the new sensor, a direct vision prism is synthesized by the vector addition of the spectral response of two matched, but independently aligned DVP's. The resulting sensor dispersion varies from zero to twice the single prism dispersion, as a function of the angle between the dispersion axes of the two prisms. The number of resolved channels, and the related signal strength per channel, also adapts with this angle. The "synthesized prism" projects a spectral image onto the focal plane array of an infrared camera. The prism is rotated on the camera axis and the resulting spectral information is employed to form an image cube (x, y, λ), using tomographic techniques. The sensor resolves from 1 to 105 spectral channels, between 3.0μm and 5.2μm wavelength. Spectral image data and image reconstruction is provided for standard test sources and scenes.

Paper Details

Date Published: 27 August 2008
PDF: 8 pages
Proc. SPIE 7055, Infrared Systems and Photoelectronic Technology III, 705506 (27 August 2008); doi: 10.1117/12.792761
Show Author Affiliations
F. D. Shepherd, Solid State Scientific Corp. (United States)
J. M. Mooney, Solid State Scientific Corp. (United States)
T. E. Reeves, Solid State Scientific Corp. (United States)
P. Dumont, Solid State Scientific Corp. (United States)
M. M. Weeks, Air Force Research Lab. (United States)
S. DiSalvo, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 7055:
Infrared Systems and Photoelectronic Technology III
Eustace L. Dereniak; John P. Hartke; Paul D. LeVan; Randolph E. Longshore; Ashok K. Sood, Editor(s)

© SPIE. Terms of Use
Back to Top