Share Email Print
cover

Proceedings Paper

A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design
Author(s): D. Nguyen; H. Cormican; A. Baysal; C. Wiswall; T. Kerr; J. M. Wang; D. Ma
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper reports the design trade off study of the design of an innovative CMOS active pixel sensor (CAPS) based on Silicon-on-Insulator (SOI) technology. The CAPS designs approach provides the flexibility and high-density features of hybrid pixel sensors with photon counting architecture. This sensor is the key component for optimized X-ray Tomosynthesis. A proof-ofprinciple test chip, paying particular attention to the noise performance of the pixel, front-end electronics (FEE) and readout speed, is available for testing in 2008. We present the design of the test chip in this paper.

Paper Details

Date Published: 3 September 2008
PDF: 11 pages
Proc. SPIE 7080, Penetrating Radiation Systems and Applications IX, 708009 (3 September 2008); doi: 10.1117/12.792554
Show Author Affiliations
D. Nguyen, Bioptics Inc. (United States)
H. Cormican, Bioptics Inc. (United States)
A. Baysal, Bioptics Inc. (United States)
C. Wiswall, Bioptics Inc. (United States)
T. Kerr, Bioptics Inc. (United States)
J. M. Wang, Univ. of Arizona (United States)
D. Ma, Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7080:
Penetrating Radiation Systems and Applications IX
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Richard C Schirato, Editor(s)

© SPIE. Terms of Use
Back to Top