Share Email Print
cover

Proceedings Paper

IEC 62942-1 TS: First international technical specification on the technical data for radiation thermometers
Author(s): J. Hollandt; O. Struss; G. Beynon; R. Bosma; R. Gaertner; F. Girard; M. S. Matveyev; H. C. McEvoy; G. R. Peacock; M. Sadli; F. Sakuma; H. W. Yoon; Z. Yuan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Technical Specification IEC 62492-1 TS: Industrial process control devices - Radiation thermometers - Part 1: Technical data for radiation thermometers will define the technical data, i.e. metrological data, to be given in data sheets and operating instructions for radiation thermometers with one wavelength range and one measurement field. It has been developed within the working group IEC SC 65B WG5 "Temperature Sensors". The content and structure of the IEC 62492-1 TS is briefly explained and an outlook on further work on radiation thermometry planned within the IEC SC 65B WG5 is given.

Paper Details

Date Published: 17 March 2008
PDF: 5 pages
Proc. SPIE 6939, Thermosense XXX, 693908 (17 March 2008); doi: 10.1117/12.792390
Show Author Affiliations
J. Hollandt, Physikalisch-Technische Bundesanstalt (Germany)
O. Struss, Heitronics Infrarot Messtechnik GmbH (Germany)
G. Beynon, Land Instruments International (United Kingdom)
R. Bosma, NMi Van Swinden Lab. B. V. (Netherlands)
R. Gaertner, Raytek GmbH (Germany)
F. Girard, Istituto Nazionale di Ricerca Metrologica (Italy)
M. S. Matveyev, D.I. Mendeleyev Institute for Metrology (Russia)
H. C. McEvoy, National Physical Lab. (United Kingdom)
G. R. Peacock, Temperatures.com, Inc. (United States)
M. Sadli, Lab. National de Métrologie et d'Essais (France)
F. Sakuma, National Metrology Institute of Japan (Japan)
H. W. Yoon, National Institute of Standards and Technology (United States)
Z. Yuan, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 6939:
Thermosense XXX
Vladimir P. Vavilov; Douglas D. Burleigh, Editor(s)

© SPIE. Terms of Use
Back to Top