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Proceedings Paper

Design and monitoring of narrow bandpass filters composed of non-quarter-wave thicknesses
Author(s): Ronald R. Willey
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Paper Abstract

Narrow bandpass filters have historically been designs of quarter waves at the passband wavelength, and have been monitored at the turning points using the passband wavelength. By direct monitoring at the passband wavelength, errors have been shown to be primarily self compensated, and have allowed much better performance than could otherwise be expected. The turning points are difficult to detect precisely and accurately because the change in transmittance with thickness becomes zero at the desired termination point. By proper design with non-quarter-wave layers, essentially the same spectral performance can be achieved by layer terminations that are far enough from turning points to be significantly more sensitive termination points. The design approach is to maintain the optical thickness of the reflector layer pairs at one half-wave of the passband wavelength, but change the ratio of the optical thicknesses of the high and low index layers. These can be adjusted enough so that the thicker layers contain two turning points and the last turning point in the layer can be more accurately and precisely determined. The error compensation benefit from the historic method should be maintained. This leads to potentially improved control during deposition and monitoring of narrow bandpass filters.

Paper Details

Date Published: 25 September 2008
PDF: 12 pages
Proc. SPIE 7101, Advances in Optical Thin Films III, 710119 (25 September 2008); doi: 10.1117/12.792361
Show Author Affiliations
Ronald R. Willey, Willey Optical, Consultants (United States)


Published in SPIE Proceedings Vol. 7101:
Advances in Optical Thin Films III
Norbert Kaiser; Michel Lequime; H. Angus Macleod, Editor(s)

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