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Proceedings Paper

Epitaxial growth and thermal dynamics of CeO2 buffer layer on textured Ni-W substrates for YBCO coated conductors
Author(s): C. Y. Pan; C. B. Cai; L. L. Ying; Y. M. Lu; Z. Y. Liu; B. Gao; J. L. Liu
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Paper Abstract

In present study, the biaxially textured CeO2 buffer layers on Ni-W substrates have been prepared by chemical solution deposition (CSD) with cerium acetate as the starting precursor, mixed with solvents of Propionic acid, Isopropanol and Acetylacetone. Typical XRD θ-2θ scans and the pole figure display well out-of-plane and in-plane textures of CeO2 films. SEM and AFM results suggest that the buffer layer have uniform and smooth surface. Meanwhile, the effects of heating rate on CeO2 formation starting from the precursor solution have been studied using differential thermal analysis (DTA). And the further analysis is given by XRD results for precursor xrogel at the corresponding temperature. Detailed high temperature optical microscope (HTOM) photographs investigate the surface characteristics evolved with temperature.

Paper Details

Date Published: 11 March 2008
PDF: 5 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69840K (11 March 2008); doi: 10.1117/12.792279
Show Author Affiliations
C. Y. Pan, Shanghai Univ. (China)
C. B. Cai, Shanghai Univ. (China)
L. L. Ying, Shanghai Univ. (China)
Y. M. Lu, Shanghai Univ. (China)
Z. Y. Liu, Shanghai Univ. (China)
B. Gao, Shanghai Univ. (China)
J. L. Liu, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications

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