Share Email Print

Proceedings Paper

Structural, electronic, and optical properties of Mn4Si7
Author(s): Y. Gao; R. S. Chen; M. Y. Zhou; M. A. Lourenco; K. P. Homewood; G. Shao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Semiconducting high manganese silicides (HMS) have attracted great research interest in the past decades for potential applications as novel optoelectronic and photovoltaic devices integrated on Si chips. The fundamental electronic properties in HMS are still unclear, and the band-gap energy was reported to scatter from 0.42 eV to 0.98 eV in the past decades. In this work, single phase semiconducting Mn4Si7 precipitates and thin films have been synthesized by ion implantation. Optical absorption spectra obtained by transmission measurements demonstrated the existence of a direct band gap in all samples. The band gap values varied in the range of 0.77 eV to 0.93 eV, corresponding to varied strain states due to different microstructures. The electronic band structures of Mn4Si7 under different strain states have been theoretically investigated by means of a full-potential linear augmented plane wave method and compared with the experimental results. From ab initio calculations, the Mn4Si7 compound is found to be a pseudo-direct band-gap semiconductor with a fundamental gap increasing linearly with the compression along c- or a-axis. This trend is in good agreement with the experimental results.

Paper Details

Date Published: 11 March 2008
PDF: 4 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69840F (11 March 2008); doi: 10.1117/12.792271
Show Author Affiliations
Y. Gao, Hubei Univ. (China)
R. S. Chen, Hubei Univ. (China)
M. Y. Zhou, Hubei Univ. (China)
M. A. Lourenco, Univ. of Surrey (United Kingdom)
K. P. Homewood, Univ. of Surrey (United Kingdom)
G. Shao, Univ. of Bolton (United Kingdom)

Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications

© SPIE. Terms of Use
Back to Top