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Proceedings Paper

Luminescence of rhodamine B doped in silica films by evaporation-induced self-assembly
Author(s): Lanfang Yao; Fengqin Lu; Chunxiao Yue; Fujiang Xie; Feifei Guan
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Paper Abstract

Rhodamine B was embedded in a matrix of mesoporous silica films by the sol-gel method. A precursor sol containing tetraethoxysilane, ethanol, surfactant cetyltrimethylammonium bromide (CTAB), water, rhodamine B and acid catalyst was prepared by sol-gel. Depositing the precursor sol on a substrate wherein evaporation of solvent and water causes the formation of mesostructured films on the substrate surface by evaporation-induced self- assembly process. The nanocomposites films were obtained by embedded rhodamine B in the pores of mesoporous silica films. The mesoporous film was characterized by XRD and TEM, UV-VIS-NIR. The luminescence was measured and a red shift in the peak of the luminescence spectra compared with rhodamine B in the film and rhodamine B in water was observed, which may be interpreted as reflecting a decrease in the dipole moment of the exited molecule. The results show the luminescence action of rhodamine B in nanopores approach to single molecule's. This relates to the restriction of nanopores to organic molecules. The degree of aggregation decreases for the mesoporous silica films may be regarded as a hydroxylic, relatively polar environment, less polar than water although controversy still exists on the role of water in causing aggregation.

Paper Details

Date Published: 11 March 2008
PDF: 4 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69840A (11 March 2008); doi: 10.1117/12.792186
Show Author Affiliations
Lanfang Yao, Univ. of Shanghai for Science and Technology (China)
Fengqin Lu, Univ. of Shanghai for Science and Technology (China)
Chunxiao Yue, Univ. of Shanghai for Science and Technology (China)
Fujiang Xie, Univ. of Shanghai for Science and Technology (China)
Feifei Guan, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications

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