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Proceedings Paper

Phase diagrams and in-plane anisotropic misfit strains of (110) Ba0.6Sr0.4TiO3 thin films grown on (001) orthorhombic NdGaO3 substrate
Author(s): P. F. Liu; X. J. Meng; J. L. Sun; J. H. Ma; J. H. Chu
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Paper Abstract

Using Landau-Devonshire(LD)-type phenomenological model, we investigate the phase diagrams and in-plane anisotropic misfit strains of single-domain single-crystal (110) Ba0.6Sr0.4TiO3 film epitaxially deposited on (001) NdGaO3 substrate. Investigation indicates that film thickness plays a crucial role on formation of in-plane anisotropic misfit strains and stable phases. As is consistent with results of experiment that anisotropic strains have greatly changes with increase of film thickness. The anisotropic strains induce tetragonal phases which only contain in-plane spontaneous polarization component. These phases do not exist in BST films of the same composition under isotropic strains. Moreover, calculation manifests that anisotropic in-plane misfit strains are almost completely relaxed when film thickness is larger than 600nm, which has been reported in experiment.

Paper Details

Date Published: 11 March 2008
PDF: 4 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 698405 (11 March 2008); doi: 10.1117/12.792157
Show Author Affiliations
P. F. Liu, Shanghai Institute of Technical Physics (China)
X. J. Meng, Shanghai Institute of Technical Physics (China)
J. L. Sun, Shanghai Institute of Technical Physics (China)
J. H. Ma, Shanghai Institute of Technical Physics (China)
J. H. Chu, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications

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