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Proceedings Paper

Adaptive wavelets applied to phase-shifting interferometry for wavefront sensing
Author(s): Katherine J. Jones
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Paper Abstract

Optical interferometry, especially the lateral Shearing interferometer, has long played a role in wavefront sensing. Phase-Shifting Interferometry and also Self-Referencing Interferometry have significant advantages over the Shack-Hartmann wavefront sensor. Phase difference between two interfering beams is determined by measuring the intensity while the phase difference between the two interfering beams is changed in a known manner three times. The phase difference can then be determined in the presence of aberration. Adaptive wavelets will be applied to Phase-Shifting Interferometry in order to address both noise and coherence and increase the depth of fringes. Phase is determined by means of wavelet ridge extraction which will increase the depth of interference fringes and improve resolution.

Paper Details

Date Published: 26 August 2008
PDF: 10 pages
Proc. SPIE 7093, Advanced Wavefront Control: Methods, Devices, and Applications VI, 70930D (26 August 2008); doi: 10.1117/12.792021
Show Author Affiliations
Katherine J. Jones, WBAO (United States)


Published in SPIE Proceedings Vol. 7093:
Advanced Wavefront Control: Methods, Devices, and Applications VI
John D. Gonglewski; Richard A. Carreras; Troy A. Rhoadarmer, Editor(s)

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